SILC

常见例句

• The generation mechanism of stress induced leakage current( SILC) in flash memory cell is studied by experiments.
  通過實騐研究了閃速存儲器存儲單元中應力誘生漏電流(ILC)産生機理.
• The results show that compared with the pure oxide gate dielectrics of the same EOT,N/O stack gate dielectrics have much better performance on the aspects of tunneling leakage current,SILC characteristics,and gate dielectrics lifetime.
  結果表明 ;同樣EOT的Si3 N4/SiO2 stack柵介質和純SiO2 柵介質比較 ;前者在柵隧穿漏電流、抗SILC性能、柵介質壽命等方麪都遠優於後者 .
• stress induced leakage current(SILC)
  應力誘生漏電流（SILC）
• Effect of Neutral Traps on Tunneling Current and SILC in Ultrathin Oxide Layer
  超薄氧化層中的中性陷阱對隧穿電流的影響和應變誘導漏電流
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